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Calibration instruments use electrical signals or physical quantities to calibrate sensors and meters. Devices that produce electrical signals can serve as precise meters for sensor calibration, or send output signals to other devices.
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Calibration standards and reference sources include any source that can provide a reference for the calibration of an instrument or comparison of a material or component.
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Energy meters measure the total energy of a single pulse and optical power meters measure the average power of a continuous light beam.
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Fiber optic power meters are instruments that measure the average power of a continuous light beam. They are used to test signal power in fiber optic networks.
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Fiber optic test equipment is used to detect the signal loss/change through a fiber optic cable.
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Illuminators are used to provide adequate contrast for imaging. Illuminators include backlights, LED illuminators, and fiber optic illuminators.
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Integration spheres are hollow optical spheres used for measuring the diffuse reflectance or transmittance of objects.
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Lux meters or light meters measure illumination in terms of luxes (lx) or foot candles (fc).
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Optical calibration standards are used to calibrate the optical properties of optical detectors and instruments.
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Optical coating services design optical coatings and apply them to crystal, fiber, glass, metal, or polymer substrates to produce optical components.
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Optical component accessories are used in the design or maintenance of optical components and systems.
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Optical manufacturing services design, fabricate, finish and test optical components and optical elements.
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Optical spectrum analyzers (OSA) can divide a lightwave signal into its constituent wavelengths. This means that it is possible to see the spectral profile of the signal over a certain wavelength range.
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Photometers produce electrical signals, which correspond to radiant flux energy, for a series of discrete wavelength intervals. They are used to measure wavelengths of light spectra and optical or atomic emissions.
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Radiometers are used to measure the intensity of electromagnetic radiation (e.g., UVC, UVB, UVA, Vis, and IR).
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Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.
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Specialty or proprietary products and accessories related to spectrometers.
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Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available.
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UV and visible spectrometers measure the amount of ultraviolet (UV) and visible light transmitted or absorbed by a sample placed in the spectrometer.
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Vision calibration targets are precision test samples or patterns that are printed or etched on a substrate of glass or other material for dimensional calibration and depth-of-field determinations of machine vision systems, cameras or microscopes.
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Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
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